Scanning Electron Microscopy: Basic Function

video-placeholder
Loading...
Ver programa

Reseñas

4.8 (2,655 calificaciones)

  • 5 stars
    83,38 %
  • 4 stars
    14,91 %
  • 3 stars
    1,39 %
  • 2 stars
    0,18 %
  • 1 star
    0,11 %

HC

4 de abr. de 2021

It's a wonderful course for anybody looking to gain some good insights on Nanotechnology along with practical exposure. Nan Jokerst, you are an amazing teacher.

Would highly recommend this course!

M

27 de may. de 2020

In my undergrad I have learned about fabrication in the VLSI course, now I have got the gest of cooking. thank you for such a course, hope I will get some further help from rtnn.org & RTNN team.

De la lección

Nano Measurement and Characterization Tools: Scanning Electron Microscopy and Energy-Dispersive X-ray Spectroscopy

Impartido por:

  • Placeholder

    Nan M. Jokerst

    J. A. Jones Professor of Electrical and Computer Engineering

  • Placeholder

    Carrie Donley

    Director of CHANL (Chapel Hill Analytical and Nanofabrication Laboratory)

  • Placeholder

    James Cahoon

    Assistant Professor

  • Placeholder

    Jacob Jones

    Professor

Explora nuestro catálogo

Inscríbete de manera gratuita y obtén recomendaciones personalizadas, actualizaciones y ofertas.